Comparison of fresh and aged lithium iron phosphate cathodes using a tailored electrochemical strain microscopy technique

• Matthias Simolka,
• Hanno Kaess and
• Kaspar Andreas Friedrich

Beilstein J. Nanotechnol. 2020, 11, 583–596, doi:10.3762/bjnano.11.46

• (Rtip around 30 nm or even larger), the ESM signal would exhibit rather diffuse signal allocation. Therefore, it is more reasonable to assume a limited probed volume close to the surface of the tip–sample junction of only a few nanometres in depth. Dependency of the ESM signal intensity during stepwise

Internalization mechanisms of cell-penetrating peptides

• Ivana Ruseska and
• Andreas Zimmer

Beilstein J. Nanotechnol. 2020, 11, 101–123, doi:10.3762/bjnano.11.10

Optical near-field mapping of plasmonic nanostructures prepared by nanosphere lithography

• Gitanjali Kolhatkar,
• Alexandre Merlen,
• Jiawei Zhang,
• Chahinez Dab,
• Gregory Q. Wallace,
• François Lagugné-Labarthet and
• Andreas Ruediger

Beilstein J. Nanotechnol. 2018, 9, 1536–1543, doi:10.3762/bjnano.9.144

• : apertureless scanning near-field optical microscopy; diffuse signal; nanosphere lithography; photomultiplier tube; plasmonic nanostructures; Introduction SNOM (scanning near-field optical microscopy) is an imaging technique based on an optical near-field probe for high spatial resolution [1][2]. A version of

• contribution, we use the Fourier transformation of the diffuse signal and filtering. This method is applied to plasmonic gold nanotriangles [19] inscribed on a glass substrate, that were prepared by nanosphere lithography [20][21][22]. Those nanostructures, that most commonly consist of arrays of metallic